Таблицы данных | Фотографии | Производитель. Часть # | Акции | Цены | А | Packaging | Series | ProductStatus | LogicType | SupplyVoltage | NumberofBits | OperatingTemperature | MountingType |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
![]() Таблицы данных |
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SN74ABT8646DWIC SCAN-TEST-DEV/XCVR 28-SOIC |
3929 | 7.81 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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MC100EL17DWGIC RCVR QUAD DIFF LINE 20-SOIC |
3286 | 12.28 |
ДобавитьРасследования |
Bulk,Tube | 100EL | Active | Differential Receiver | 4.2V ~ 5.7V | 4 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74BCT8245ADWIC SCAN TEST DEVICE TXRX 24-SOIC |
3686 | 8.40 |
ДобавитьРасследования |
Bulk,Tube | 74BCT | Active | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount |
![]() Таблицы данных |
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SN74LVT8986PMIC LINK ADDRSS SCAN-PORT 64-LQFP |
586 | 9.84 |
ДобавитьРасследования |
Bulk,Tray | 74LVT | Active | Linking Addressable Scan Ports | 2.7V ~ 3.6V | - | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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NB100LVEP17DTR2GIC DRV/RCV ECL QUAD DIFF 20TSSOP |
2645 | 12.23 |
ДобавитьРасследования |
Tape & Reel (TR),Bulk | 100LVEP | Active | Differential Receiver/Driver | 2.375V ~ 3.8V | 4 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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74SSTUB32868AZRHRIC REGSTR BUFFER 28-56BIT 176BGA |
2166 | 11.36 |
ДобавитьРасследования |
Tape & Reel (TR),Cut Tape (CT),Digi-Reel®,Bulk | 74SSTUB | Active | 1:2 Configurable Registered Buffer with Parity | 1.7V ~ 1.9V | 28 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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74SSTUB32868ZRHRIC CONFIG REG BUFF 28BIT 176-BGA |
2896 | 11.36 |
ДобавитьРасследования |
Tape & Reel (TR),Cut Tape (CT),Bulk | 74SSTUB | Active | 1:2 Configurable Registered Buffer with Parity | 1.7V ~ 1.9V | 28 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT18640DLIC SCAN-TEST-DEV/TXRX 56-SSOP |
3983 | 9.36 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Scan Test Device with Inverting Bus Transceivers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT8652DLIC SCAN-TEST-DEV/XCVR 28-SSOP |
3225 | 10.36 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT8652DWIC SCAN TEST DEVICE 28-SOIC |
2176 | 9.42 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT8543DWIC SCAN TEST DEV/TXRX 28-SOIC |
3205 | 9.47 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT8543DLIC SCAN TEST DEV/TXRX 28-SSOP |
3497 | 10.34 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74LVT8980ADWIC TEST-BUS CONTROLLER 24-SOIC |
3872 | 11.64 |
ДобавитьРасследования |
Bulk,Tube | 74LVT | Active | Embedded Test-Bus Controllers | 2.7V ~ 3.6V | 8 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74LVTH182652APMIC SCAN TEST DEVICE ABT 64-LQFP |
2866 | 12.57 |
ДобавитьРасследования |
Bulk,Tray | 74LVTH | Active | ABT Scan Test Device With Transceivers and Registers | 2.7V ~ 3.6V | 18 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74LVTH182646APMIC SCAN-TEST-DEV/XCVR 64-LQFP |
2717 | 12.57 |
ДобавитьРасследования |
Bulk,Tray | 74LVTH | Active | ABT Scan Test Device With Transceivers and Registers | 2.7V ~ 3.6V | 18 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABTH18652APMIC SCAN-TEST-DEV/TXRX 64-LQFP |
2985 | 12.66 |
ДобавитьРасследования |
Bulk,Tray | 74ABTH | Active | Scan Test Device With Transceivers And Registers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT18504PMIC SCAN-TEST-DEV/TXRX 64-LQFP |
2773 | 12.89 |
ДобавитьРасследования |
Bulk,Tray | 74ABT | Active | Scan Test Device with Universal Bus Transceivers | 4.5V ~ 5.5V | 20 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT8996PWIC ADDRESSABLE SCAN PORT 24TSSOP |
2913 | 12.15 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Addressable Scan Ports | 4.5V ~ 5.5V | 10 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT8996DWIC ADDRESSABLE SCAN PORT 24-SOIC |
2243 | 12.15 |
ДобавитьРасследования |
Bulk,Tube | 74ABT | Active | Addressable Scan Ports | 4.5V ~ 5.5V | 10 | -40°C ~ 85°C | Surface Mount |
![]() Таблицы данных |
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SN74ABT18652PMIC SCAN-TEST-DEV/TXRX 64-LQFP |
2478 | 14.03 |
ДобавитьРасследования |
Bulk,Tray | 74ABT | Active | Scan Test Device With Transceivers And Registers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount |